The Agrowtek SXIR Infrared Temperature Sensor provides precise, non-contact surface temperature monitoring for plant canopies, leaves, growing media, and equipment. Mounted above the canopy or within tiered growing systems, the SXIR helps growers identify temperature differences that may not be visible through ambient air measurements alone.
When integrated with EnvOS®, SXIR data can be monitored alongside air temperature, humidity, lighting, and other environmental conditions. Leaf temperature can also support more accurate vapor pressure deficit (VPD) analysis, helping growers better understand plant conditions and environmental performance.
The rugged, weather-resistant enclosure is designed for permanent installation in indoor growing environments. A stainless-steel mounting bracket and 37.5° sensing angle provide flexibility for canopy, rack, and equipment monitoring.
Key features:
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Non-contact infrared surface temperature measurement
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Suitable for leaf, canopy, growing-media, and equipment monitoring
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Supports plant-level temperature and VPD analysis
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Measurement range: −40 to 85°C (−40 to 185°F)
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Typical accuracy: ±0.3°C
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37.5° measurement cone
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GrowNET™ and Modbus RTU communication
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Weather-resistant enclosure for indoor installations
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Stainless-steel mounting bracket
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Integrates with Microclimates EnvOS®
